Atomic-force Microscopy and Its Applications

Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as sp...

Full description

Saved in:
Bibliographic Details
Main Author: Tomasz Tański (auth)
Other Authors: Bogusław Ziębowicz (auth), Marcin Staszuk (auth)
Format: eBook
Published: IntechOpen 2019
Subjects:
Online Access:DOAB: download the publication
DOAB: description of the publication
Tags: Add Tag
No Tags, Be the first to tag this record!