Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons /

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It desc...

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Bibliographic Details
Main Author: Schubert, Mathias. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
Series:Springer Tracts in Modern Physics, 209
Subjects:
Online Access:http://dx.doi.org/10.1007/b11964
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